A New and Fast Approach to Very Large Scale Integrated...

Operations Research 1997 / 12 Vol. 45; Iss. 6

A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation

Adams, J. B., Hochbaum, D. S.
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Volume:
45
Language:
english
Journal:
Operations Research
DOI:
10.1287/opre.45.6.842
Date:
December, 1997
File:
PDF, 1.51 MB
english, 1997
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