Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure
Uluşan, A. Büyükbaş, Tataroğlu, A.Language:
english
Journal:
Silicon
DOI:
10.1007/s12633-017-9722-y
Date:
March, 2018
File:
PDF, 1.54 MB
english, 2018