Soft-type trap-induced degradation of MoS2 field effect...

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Nanotechnology 2018 / 03

Soft-type trap-induced degradation of MoS2 field effect transistors

Cho, Young-Hoon, Ryu, Min-Yeul, Lee, Kook Jin, Park, So Jeong, Choi, Jun Hee, Lee, Byung Chul, Kim, Wung-Yeon, Kim, Gyu-Tae
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Language:
english
Journal:
Nanotechnology
DOI:
10.1088/1361-6528/aab4d3
Date:
March, 2018
File:
PDF, 1.24 MB
english, 2018
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