[IEEE 2017 75th Device Research Conference (DRC) - South Bend, IN, USA (2017.6.25-2017.6.28)] 2017 75th Annual Device Research Conference (DRC) - Scaling of 4H-SiC p-i-n photodiodes for high temperature applications
Hou, Shuoben, Hellstrom, Per-Erik, Zetterling, Carl-Mikael, Ostling, MikaelYear:
2017
Language:
english
DOI:
10.1109/DRC.2017.7999445
File:
PDF, 921 KB
english, 2017