[IEEE 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Yangzhou, China (2017.10.20-2017.10.22)] 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Effective critical gate identification for mitigating circuit aging using gate replacement
Qingwu, Wu, Maoxiang, Yi, Shiqi, Yuan, Yao, Zhang, Li, Ding, Huaguo, LiangYear:
2017
Language:
english
DOI:
10.1109/ICEMI.2017.8265940
File:
PDF, 416 KB
english, 2017