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[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Failure analysis of IC contains FinFET
Chu, C. H., Kuo, P. S, Chang, T. F., Yang, J. X., Chang, Jum, Yang, RayYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060056
File:
PDF, 725 KB
english, 2017