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[IEEE 2017 International Conference on Applied Electronics (AE) - Pilsen, Czech Republic (2017.9.5-2017.9.6)] 2017 International Conference on Applied Electronics (AE) - Performance analysis of monolithically integrated depletion-/enhancement-mode InAlN/GaN heterostructure HEMT transistors
Nagy, Lukas, Chvala, Ales, Stopjakova, Viera, Blaho, Michal, Kuzmik, Jan, Gregusova, Dagmar, Satka, AlexanderYear:
2017
Language:
english
DOI:
10.23919/ae.2017.8053599
File:
PDF, 563 KB
english, 2017