[IEEE 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Moscow and St. Petersburg, Russia (2018.1.29-2018.2.1)] 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - An approach to automatic test generation for verification of microprocessor cores
Gagarina, Larisa G., Garashchenko, Anton V., Shiryaev, Alexey P., Fedorov, Alexey R., Dorogova, Ekaterina G.Year:
2018
Language:
english
DOI:
10.1109/EIConRus.2018.8317379
File:
PDF, 281 KB
english, 2018