[IEEE 2017 International Conference on Applied Electronics (AE) - Pilsen, Czech Republic (2017.9.5-2017.9.6)] 2017 International Conference on Applied Electronics (AE) - Electrical properties optimization of stripline for EMC testing of automotive parts
Kubik, Zdenek, Skala, JiriYear:
2017
Language:
english
DOI:
10.23919/AE.2017.8053589
File:
PDF, 394 KB
english, 2017