Elemental mapping of large samples by external ion beam...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2018 / 05 Vol. 422

Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications

Silva, T.F., Rodrigues, C.L., Added, N., Rizzutto, M.A., Tabacniks, M.H., Mangiarotti, A., Curado, J.F., Aguirre, F.R., Aguero, N.F., Allegro, P.R.P., Campos, P.H.O.V., Restrepo, J.M., Trindade, G.F.,
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Volume:
422
Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
DOI:
10.1016/j.nimb.2018.03.006
Date:
May, 2018
File:
PDF, 1.24 MB
english, 2018
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