[IEEE 2017 IEEE 2nd Advanced Information Technology, Electronic and Automation Control Conference (IAEAC) - Chongqing, China (2017.3.25-2017.3.26)] 2017 IEEE 2nd Advanced Information Technology, Electronic and Automation Control Conference (IAEAC) - Application of HHT in SRM fault feature extraction
Ruikun, Yang, Ruiqing, Ma, Peng, BaiYear:
2017
Language:
english
DOI:
10.1109/IAEAC.2017.8053976
File:
PDF, 1.26 MB
english, 2017