Impact of Device Area and Film Thickness on Performance of...

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IEEE Electron Device Letters 2018

Impact of Device Area and Film Thickness on Performance of Sol-gel Processed ZrO2 RRAM

Lee, Sojeong, Kim, Taegyun, Jang, Bongho, Lee, Won-Yong, Song, Kyu Chan, Kim, Hyun Seo, Do, Gyung Yeop, Hwang, Seung Bum, Chung, Seungjun, Jang, Jaewon
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Year:
2018
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2820141
File:
PDF, 720 KB
english, 2018
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