Degradation Data-Driven Time-To-Failure Prognostics...

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IEEE Transactions on Industrial Electronics 2018

Degradation Data-Driven Time-To-Failure Prognostics Approach for Rolling Element Bearings in Electrical Machines

Wu, Jun, Wu, Chaoyong, Cao, Shuai, Or, Siu Wing, Deng, Chao, Shao, Xinyu
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/TIE.2018.2811366
File:
PDF, 1.75 MB
english, 2018
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