Failure probability of a FinFET-based SRAM cell utilizing...

  • Main
  • 2018 / 3
  • Failure probability of a FinFET-based SRAM cell utilizing...
Integration, the VLSI Journal 2018 / 3

Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point

Noltsis, Michail, Maragkoudaki, Eleni, Rodopoulos, Dimitrios, Catthoor, Francky, Soudris, Dimitrios
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Integration
DOI:
10.1016/j.vlsi.2018.03.016
Date:
March, 2018
File:
PDF, 1.11 MB
english, 2018
Conversion to is in progress
Conversion to is failed