[IEEE 2017 32nd Conference on Design of Circuits and...

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[IEEE 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Barcelona, Spain (2017.11.22-2017.11.24)] 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Design and validation of a platform for electromagnetic fault injection

Balasch, Josep, Arumi, Daniel, Manich, Salvador
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Year:
2017
Language:
english
DOI:
10.1109/DCIS.2017.8311630
File:
PDF, 694 KB
english, 2017
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