![](/img/cover-not-exists.png)
[IEEE 2017 IEEE International Conference on Circuits and Systems (ICCS) - Thiruvananthapuram, Kerala, India (2017.12.20-2017.12.21)] 2017 IEEE International Conference on Circuits and Systems (ICCS) - Performance analysis of FinFET and negative capacitance FET over 6T SRAM
Vaithiyanathan, D., Raj, M. Bharathi, Pushpa, S. Ewins Pon, Seetharaman, R.Year:
2017
Language:
english
DOI:
10.1109/ICCS1.2017.8325989
File:
PDF, 742 KB
english, 2017