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Tunnel FET Analog Benchmarking and Circuit Design
Lu, Hao, Paletti, Paolo, Li, Wenjun, Fay, Patrick, Ytterdal, Trond, Seabaugh, AlanYear:
2018
Language:
english
Journal:
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
DOI:
10.1109/JXCDC.2018.2817541
File:
PDF, 966 KB
english, 2018