The Gaussian-Lorentzian Sum, Product, and Convolution (Voigt) Functions in the Context of Peak Fitting X-ray Photoelectron Spectroscopy (XPS) Narrow Scans
Jain, Varun, Biesinger, Mark C., Linford, Matthew R.Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2018.03.190
Date:
March, 2018
File:
PDF, 1.20 MB
english, 2018