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Dependence of structural and optoelectronic properties on thickness of γ-cui thin films deposited by vacuum thermal evaporation
Dintle, Lawrence K., Luhanga, Pearson V.C., Moditswe, Charles, Muiva, Cosmas M.Language:
english
Journal:
MRS Advances
DOI:
10.1557/adv.2018.317
Date:
March, 2018
File:
PDF, 1.38 MB
english, 2018