Ab-initio determination of porous silicon refractive index...

Ab-initio determination of porous silicon refractive index confirmed by infrared transmittance measurements of an omnidirectional multilayer reflector

Palavicini, Alessio, Wang, Chumin
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Volume:
124
Language:
english
Journal:
Applied Physics B
DOI:
10.1007/s00340-018-6938-5
Date:
April, 2018
File:
PDF, 4.02 MB
english, 2018
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