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Stability of boron-doped graphene/copper interface: DFT, XPS and OSEE studies
Boukhvalov, D.W., Zhidkov, I.S., Kukharenko, A.I., Slesarev, A.I., Zatsepin, A.F., Cholakh, S.O., Kurmaev, E.Z.Volume:
441
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2018.02.074
Date:
May, 2018
File:
PDF, 1.31 MB
english, 2018