[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Improved single-event hardness of trench power MOSFET with a widened split gate
Lu, Jiang, Liu, Hainan, Luo, Jiajun, Wang, Lixin, Li, Bo, Li, Binhong, Zhang, Guohuan, Han, ZhengshengYear:
2016
Language:
english
DOI:
10.1109/RADECS.2016.8093147
File:
PDF, 866 KB
english, 2016