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[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Hump-effect impact on subthreshold VLSI circuit
Coustans, Mathieu, Gauthey, Darryl, Rota, Sergio, Acovic, Alexandre, Habas, Predrag, Meyer, ReneYear:
2017
Language:
english
DOI:
10.1109/S3S.2017.8309252
File:
PDF, 1.39 MB
english, 2017