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Contribution to Silicon-Carbide-MESFET ESD robustness analysis
Phulpin, T., Isoird, K., Tremouilles, D., Austin, P., Perpinya, X., Leon, J., Vellvehi, M.Year:
2018
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2018.2817255
File:
PDF, 3.51 MB
english, 2018