[ASME ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - Washington, DC, USA (August 28–31, 2011)] Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference - Design for Patentability (DFP)
Naidu, Prakash C. R. J., Naidu, Kshirsagar C. J.Year:
2011
Language:
english
DOI:
10.1115/DETC2011-48609
File:
PDF, 229 KB
english, 2011