[IEEE 2017 American Control Conference (ACC) - Seattle, WA, USA (2017.5.24-2017.5.26)] 2017 American Control Conference (ACC) - Beyond the identification of reliability for system with binary subsystems
Long Wang,, Spall, James C.Year:
2017
Language:
english
DOI:
10.23919/ACC.2017.7962947
File:
PDF, 298 KB
english, 2017