Research on optical reflectance and infrared emissivity of...

Infrared Physics & Technology 2018 / 06 Vol. 91

Research on optical reflectance and infrared emissivity of TiN x films depending on sputtering pressure

Lu, Linlin, Luo, Fa, Huang, Zhibin, Zhou, Wancheng, Zhu, Dongmei
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Volume:
91
Language:
english
Journal:
Infrared Physics & Technology
DOI:
10.1016/j.infrared.2018.03.026
Date:
June, 2018
File:
PDF, 1.24 MB
english, 2018
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