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[IEEE 2017 IEEE International Conference on Electro Information Technology (EIT) - Lincoln, NE, USA (2017.5.14-2017.5.17)] 2017 IEEE International Conference on Electro Information Technology (EIT) - Simulation and modeling of dielectric barrier impact on heterogeneous electric field
Foruzan, Elham, Akmal, Amir A. S., Niayesh, Kaveh, Lin, Jeremy, Deepak Sharma, Desh, Sangrody, HosseinYear:
2017
Language:
english
DOI:
10.1109/EIT.2017.8053333
File:
PDF, 705 KB
english, 2017