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[IEEE 2017 IEEE 3rd International Conference on Electro-Technology for National Development (NIGERCON) - Owerri (2017.11.7-2017.11.10)] 2017 IEEE 3rd International Conference on Electro-Technology for National Development (NIGERCON) - Kriging based model for path loss prediction in the VHF band

Abdulrasheed, I. Y., Faruk, Nasir, Surajudeen-Bakinde, N. T., Olawoyin, Lukman A., Oloyede, Abdulkareem A., Popoola, Segun I.
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Year:
2017
Language:
english
DOI:
10.1109/NIGERCON.2017.8281892
File:
PDF, 896 KB
english, 2017
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