Yield Stress Determination by the Massachusetts Institute...

Nuclear Technology 1990 / 12 Vol. 92; Iss. 3

Yield Stress Determination by the Massachusetts Institute of Technology Miniaturized Disk Bend Test

Sohn, Dong-Seong, Kohse, Gordon E., Parks, David M., Harling, Otto K.
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Volume:
92
Language:
english
Journal:
Nuclear Technology
DOI:
10.13182/NT90-A16239
Date:
December, 1990
File:
PDF, 724 KB
english, 1990
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