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Analysis of Ti and TiO 2 nanolayers by total reflection X-ray photoelectron spectroscopy
Kubala-Kukuś, A., Banaś, D., Stabrawa, I., Szary, K., Sobota, D., Majewska, U., Wudarczyk-Moćko, J., Braziewicz, J., Pajek, M.Language:
english
Journal:
Spectrochimica Acta Part B: Atomic Spectroscopy
DOI:
10.1016/j.sab.2018.03.012
Date:
March, 2018
File:
PDF, 6.07 MB
english, 2018