[IEEE 2017 CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON) - Pucon (2017.10.18-2017.10.20)] 2017 CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON) - Cocoa bean quality assessment by using hyperspectral index for determining the state of fermentation with a non-destructive analysis
Soto, Juan, Paiva, Ernesto, Ipanaque, William, Reyes, Jorge, Espinoza, Daniel, Mendoza, DavidYear:
2017
DOI:
10.1109/CHILECON.2017.8229718
File:
PDF, 368 KB
2017