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A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors
Klosowski, M., Jakusz, J., Jendernalik, W., Blakiewicz, G., Szczepanski, S., Koziel, S.Year:
2018
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2018.2814118
File:
PDF, 1.83 MB
english, 2018