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Comprehensive analysis of low-frequency noise variability components in bulk and fully depleted silicon-on-insulator metal–oxide–semiconductor field-effect transistor
Maekawa, Keiichi, Makiyama, Hideki, Yamamoto, Yoshiki, Hasegawa, Takumi, Okanishi, Shinobu, Sonoda, Kenichiro, Shinkawata, Hiroki, Yamashita, Tomohiro, Kamohara, Shiro, Yamaguchi, YasuoVolume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.04FD19
Date:
April, 2018
File:
PDF, 5.03 MB
english, 2018