[IEEE 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2017.5.30-2017.6.2)] 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Dual Damascene Compatible, Copper Rich Alloy Based Surface Passivation Mechanism for Achieving Cu-Cu Bonding at 150 Degree C for 3D IC Integration
Panigrahi, Asisa Kumar, Ghosh, Tamal, Vanjari, Siva Rama Krishna, Singh, Shiv GovindYear:
2017
Language:
english
DOI:
10.1109/ECTC.2017.127
File:
PDF, 411 KB
english, 2017