Electrical Probing Test for Characterizing Wideband Optical...

  • Main
  • 2018
  • Electrical Probing Test for Characterizing Wideband Optical...

Electrical Probing Test for Characterizing Wideband Optical Transceiving Devices with Self-reference and On-chip Capability

Zhang, Shangjian, Wang, Heng, Zou, Xinhai, Zhang, Chong, Zhang, Yali, Zhang, Zhiyao, Liu, Yong, Peters, Jonathan D., Bowers, John E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2018
Language:
english
Journal:
Journal of Lightwave Technology
DOI:
10.1109/JLT.2018.2822944
File:
PDF, 1.48 MB
english, 2018
Conversion to is in progress
Conversion to is failed