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Electrical Probing Test for Characterizing Wideband Optical Transceiving Devices with Self-reference and On-chip Capability
Zhang, Shangjian, Wang, Heng, Zou, Xinhai, Zhang, Chong, Zhang, Yali, Zhang, Zhiyao, Liu, Yong, Peters, Jonathan D., Bowers, John E.Year:
2018
Language:
english
Journal:
Journal of Lightwave Technology
DOI:
10.1109/JLT.2018.2822944
File:
PDF, 1.48 MB
english, 2018