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Modeling the Endurance Reliability of Intradisk RAID Solutions for Mid-1X TLC NAND Flash Solid-State Drives
Zambelli, Cristian, Marelli, Alessia, Micheloni, Rino, Olivo, PieroVolume:
17
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2017.2749639
Date:
December, 2017
File:
PDF, 1.84 MB
english, 2017