[IEEE 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge (2017.10.23-2017.10.25)] 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Investigating the effects of process variations and system workloads on endurance of non-volatile caches

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