[IEEE 2017 IEEE International Symposium on Defect and Fault...

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[IEEE 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge (2017.10.23-2017.10.25)] 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - A scrubbing scheduling approach for reliable FPGA multicore processors with real-time constraints

Psarakis, Mihalis, Sari, Aitzan
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Year:
2017
Language:
english
DOI:
10.1109/DFT.2017.8244441
File:
PDF, 295 KB
english, 2017
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