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[IEEE 2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) - Haining (2017.12.14-2017.12.16)] 2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) - An identification method of counterfeit components based on physical analysis test technology
Chen, Zhengping, Zhang, Sujuan, Qiu, YaoYear:
2017
Language:
english
DOI:
10.1109/EDAPS.2017.8277025
File:
PDF, 1.04 MB
english, 2017