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[IEEE 2017 IEEE International Conference on Circuits and Systems (ICCS) - Thiruvananthapuram, Kerala, India (2017.12.20-2017.12.21)] 2017 IEEE International Conference on Circuits and Systems (ICCS) - A novel method based on chan vese segmentation for salient structure detection
Babu, Giltta, Aneesh, R. P., Nayar, Gayathri R.Year:
2017
Language:
english
DOI:
10.1109/ICCS1.2017.8326033
File:
PDF, 282 KB
english, 2017