[IEEE IECON 2017 - 43rd Annual Conference of the IEEE...

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[IEEE IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Beijing (2017.10.29-2017.11.1)] IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Submodule short-circuit fault diagnosis based on wavelet transform and support vector machines for modular multilevel converter with series and parallel connectivity

Wang, Chuang, Lizana, F. Ricardo, Li, Zunchao, Peterchev, Angel V., Goetz, Stefan M.
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Year:
2017
Language:
english
DOI:
10.1109/IECON.2017.8216547
File:
PDF, 453 KB
english, 2017
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