In-depth study of in-trap high-resolution mass separation...

In-depth study of in-trap high-resolution mass separation by transversal ion ejection from a multi-reflection time-of-flight device

Fischer, Paul, Knauer, Stefan, Marx, Gerrit, Schweikhard, Lutz
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Volume:
89
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5009167
Date:
January, 2018
File:
PDF, 5.17 MB
english, 2018
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