[IEEE 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Washington, DC, USA (2017.8.7-2017.8.11)] 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Near-field scanning and its EMC applications
Liu, En-Xiao, Zhao, Wei-Jiang, Wang, Binfang, Gao, Siping, Wei, Xing-ChangYear:
2017
Language:
english
DOI:
10.1109/ISEMC.2017.8077889
File:
PDF, 495 KB
english, 2017