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[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - A study of interferences inside an RF switch array in 45nm SOI CMOS
Wang, Chenkun, Lu, Fei, Chen, Qi, Zhang, Feilong, Li, Cheng, Wang, Dawn, Wang, AlbertYear:
2017
Language:
english
DOI:
10.1109/S3S.2017.8309266
File:
PDF, 1.30 MB
english, 2017