The Effects of a Thermal Recovery Process in In-Ga-Zn-O (IGZO) Thin Films Transistor
Park, Hyung-Youl, Yoo, Gwangwe, Lee, Hanjae, Lim, Myung-Hoon, Baek, Jung Woo, Choi, Changhwan, Park, Jin-HongVolume:
16
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2016.13541
Date:
November, 2016
File:
PDF, 2.78 MB
english, 2016