Statistical investigations of an ENIG Nickel film morphology by Atomic Force Microscopy
Germanicus, Rosine Coq, Leclère, Philippe, Hug, Eric, Lallemand, Florent, Descamps, Philippe, Coulié, K., Micolau, G., Febvre, P.Volume:
12
Year:
2016
Language:
english
Journal:
E3S Web of Conferences
DOI:
10.1051/e3sconf/20161204003
File:
PDF, 311 KB
english, 2016