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Geometric structure of Sn dopants in sputtered TiO2 film revealed by x-ray absorption spectroscopy and first-principles DFT calculations
Okajima, Toshihiro, Jia, Junjun, Shigesato, YuzoLanguage:
english
Journal:
Materials Research Express
DOI:
10.1088/2053-1591/aabc37
Date:
April, 2018
File:
PDF, 1.10 MB
english, 2018