[IEEE 2017 IEEE Electric Ship Technologies Symposium (ESTS) - Arlington, VA, USA (2017.8.14-2017.8.17)] 2017 IEEE Electric Ship Technologies Symposium (ESTS) - Effects of parasitic inductance on performance of 600-V GaN devices
Sellers, Andrew J., Tine, Cheikh, Kini, Roshan L., Hontz, Michael R., Khanna, Raghav, Lemmon, Andrew N., Shahabi, Ali, New, ChristopherYear:
2017
Language:
english
DOI:
10.1109/ESTS.2017.8069259
File:
PDF, 1.35 MB
english, 2017