[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Enhanced nFinFET ESD performance
Lee, Jian-Hsing, Prabhu, Manjunatha, Iyer, Natarajan Mahadeva, Banghart, Edmund, Li, You, Yu, Ronghua, Poro, Richard, Hogle, Nicholas, Gebreselaie, Ephrem, Pandey, Shesh Mani, Gauthier, RobertYear:
2017
Language:
english
DOI:
10.23919/EOSESD.2017.8073416
File:
PDF, 7.37 MB
english, 2017